Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.11851/6679
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dc.contributor.authorMiyajima, Shigeyuki-
dc.contributor.authorOrtlepp, Thomas-
dc.contributor.authorToepfer, Hannes-
dc.contributor.authorBozbey, Ali-
dc.contributor.authorFujimaki, Akira-
dc.date.accessioned2021-09-11T15:43:10Z-
dc.date.available2021-09-11T15:43:10Z-
dc.date.issued2013en_US
dc.identifier.issn0021-4922-
dc.identifier.urihttps://doi.org/10.7567/JJAP.52.033101-
dc.identifier.urihttps://hdl.handle.net/20.500.11851/6679-
dc.description.abstractWe evaluated the relationship between the gray zone width and the operating margin for comparators composed of quasi-one-junction superconducting quantum interference devices (QOSs) with shunt resistors, which are often used as high-speed readout circuits in multiple superconductor detector systems. The gray zone width is a good measure of current sensitivity of a single-bit comparator. We numerically analyzed the gray zone width of a QOS comparator and determined the circuit parameters. The gray zone width obtained from the experiments concurred with the results of the numerical analysis and was 2-3 mu A at 4.2 K in a QOS comparator composed of three Nb/AlOx/Nb junctions with critical currents of less than 90 mu A. The experimentally obtained operating margin for the bias current provided to the comparator was +/- 15% at the bias current of around 140 mu A. These results show that QOS comparators are promising for readout circuits operating up to tens of GHz and imply that gray zone width is the thermal noise in the resistors at 4.2 K. (c) 2013 The Japan Society of Applied Physicsen_US
dc.description.sponsorshipSENTANJapan Science & Technology Agency (JST); JSTJapan Science & Technology Agency (JST); Ministry of Education, Culture, Sports, Science and Technology of JapanMinistry of Education, Culture, Sports, Science and Technology, Japan (MEXT) [23226019]; Grants-in-Aid for Scientific ResearchMinistry of Education, Culture, Sports, Science and Technology, Japan (MEXT)Japan Society for the Promotion of ScienceGrants-in-Aid for Scientific Research (KAKENHI) [23226019] Funding Source: KAKENen_US
dc.description.sponsorshipThis work was supported by SENTAN, JST, and a Grant-in-Aid for Scientific Research (S) (No. 23226019) from the Ministry of Education, Culture, Sports, Science and Technology of Japan. The National Institute of Advanced Industrial Science and Technology partially contributed to the circuit fabrication.en_US
dc.language.isoenen_US
dc.publisherJapan Soc Applied Physicsen_US
dc.relation.ispartofJapanese Journal of Applied Physicsen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subject[No Keywords]en_US
dc.titleExperimental Demonstration and Numerical Analysis of Microampere Gray Zone Width With Enhanced Operating Margin in Shunted Quasi-One Junction Superconducting Quantum Interference Device Comparatorsen_US
dc.typeArticleen_US
dc.departmentFaculties, Faculty of Engineering, Department of Electrical and Electronics Engineeringen_US
dc.departmentFakülteler, Mühendislik Fakültesi, Elektrik ve Elektronik Mühendisliği Bölümütr_TR
dc.identifier.volume52en_US
dc.identifier.issue3en_US
dc.authorid0000-0003-2747-310X-
dc.authorid0000-0001-9665-7661-
dc.authorid0000-0002-5153-5537-
dc.identifier.wosWOS:000315668900021en_US
dc.identifier.scopus2-s2.0-84875488409en_US
dc.institutionauthorBozbey, Ali-
dc.identifier.doi10.7567/JJAP.52.033101-
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.identifier.scopusqualityQ1-
item.openairetypeArticle-
item.languageiso639-1en-
item.grantfulltextnone-
item.fulltextNo Fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.cerifentitytypePublications-
crisitem.author.dept02.5. Department of Electrical and Electronics Engineering-
Appears in Collections:Elektrik ve Elektronik Mühendisliği Bölümü / Department of Electrical & Electronics Engineering
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection
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