Please use this identifier to cite or link to this item:
https://hdl.handle.net/20.500.11851/5750
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DC Field | Value | Language |
---|---|---|
dc.contributor.author | Abella J. | - |
dc.contributor.author | vera X. | - |
dc.contributor.author | Ünsal O. | - |
dc.contributor.author | Ergin, Oğuz | - |
dc.contributor.author | González A. | - |
dc.date.accessioned | 2021-09-11T15:19:53Z | - |
dc.date.available | 2021-09-11T15:19:53Z | - |
dc.date.issued | 2007 | en_US |
dc.identifier.citation | IOLTS 2007 13th IEEE International On-Line Testing Symposium, 8 July 2007 through 11 July 2007, Heraklion, Crete, 72540 | en_US |
dc.identifier.isbn | 0769529186; 9780769529189 | - |
dc.identifier.uri | https://doi.org/10.1109/IOLTS.2007.34 | - |
dc.identifier.uri | https://hdl.handle.net/20.500.11851/5750 | - |
dc.description.abstract | This paper proposes the fuse, a technique to anticipate failures due to degradation in any ALU (Arithmetic Logic Unit), and particularly in an adder. The fuse consists of a replica of the weakest transistor in the adder and the circuitry required to measure its degradation. By mimicking the behavior of the replicated transistor the fuse anticipates the failure short before the first failure in the adder appears, and hence, data corruption and program crashes can be avoided. Our results show that the fuse anticipates the failure in more than 99.9% of the cases after 96.6% of the lifetime, even for pessimistic random within-die variations. © 2007 IEEE. | en_US |
dc.description.sponsorship | IEEE Computer Society;Test Technology Technical Council (TTTC) | en_US |
dc.language.iso | en | en_US |
dc.relation.ispartof | Proceedings - IOLTS 2007 13th IEEE International On-Line Testing Symposium | en_US |
dc.rights | info:eu-repo/semantics/openAccess | en_US |
dc.title | Fuse: a Technique To Anticipate Failures Due To Degradation in Alus | en_US |
dc.type | Conference Object | en_US |
dc.department | Faculties, Faculty of Engineering, Department of Computer Engineering | en_US |
dc.department | Fakülteler, Mühendislik Fakültesi, Bilgisayar Mühendisliği Bölümü | tr_TR |
dc.identifier.startpage | 15 | en_US |
dc.identifier.endpage | 22 | en_US |
dc.identifier.scopus | 2-s2.0-46749083847 | en_US |
dc.institutionauthor | Ergin, Oğuz | - |
dc.identifier.doi | 10.1109/IOLTS.2007.34 | - |
dc.relation.publicationcategory | Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı | en_US |
dc.relation.conference | IOLTS 2007 13th IEEE International On-Line Testing Symposium | en_US |
item.openairetype | Conference Object | - |
item.languageiso639-1 | en | - |
item.grantfulltext | none | - |
item.fulltext | No Fulltext | - |
item.openairecristype | http://purl.org/coar/resource_type/c_18cf | - |
item.cerifentitytype | Publications | - |
crisitem.author.dept | 02.3. Department of Computer Engineering | - |
Appears in Collections: | Bilgisayar Mühendisliği Bölümü / Department of Computer Engineering Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection |
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