Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.11851/4061
Full metadata record
DC FieldValueLanguage
dc.contributor.authorKöymen, H.-
dc.contributor.authorAhıska, Y.-
dc.contributor.authorAtalar, A.-
dc.contributor.authorKöymen, Itır-
dc.contributor.authorTaşdelen, A. S.-
dc.contributor.authorYılmaz, M.-
dc.date.accessioned2021-01-25T11:32:58Z-
dc.date.available2021-01-25T11:32:58Z-
dc.date.issued2020-09
dc.identifier.citationKoymen, H., Ahiska, Y., Atalar, A., Köymen, I., Tasdelen, A. S., and Yilmaz, M. (2020, September). Mic-in-CMOS: CMUT as a Sealed-Gap Capacitive Microphone. In 2020 IEEE International Ultrasonics Symposium (IUS) (pp. 1-4). IEEE.en_US
dc.identifier.isbn978-172815448-0
dc.identifier.issn19485719
dc.identifier.urihttps://hdl.handle.net/20.500.11851/4061-
dc.identifier.urihttps://ieeexplore.ieee.org/document/9251557-
dc.description.abstractThe design and production of a CMOS compatible, watertight and ingress-proof CMUT (capacitive micromachined ultrasonic transducer) microphone, mic-in-CMOS, with vacuum-gap is described. We present an analytical model-based approach for the design of mic-in-CMOS, where a basis for quantitative comparison of performance trade-offs is provided. The sealed vacuum gap of the mic-in-CMOS is basically a lossless sensor, free of mechanical noise. Its SNR is determined by the noise of the pre-amplification electronics (the noise contributor in a CMUT with vacuum gap is essentially the radiation resistance, which is less than 0 dBA for audio band for a 1 mm2 device). The design of mic-in-CMOS involves many multilateral trade-offs such as gap height vs membrane thickness vs sensitivity vs need for linear operation vs bias voltage and atmospheric depression, to name few. The mic-in-CMOS design can be mass produced using CMOS film stacks only, as such the fabrication process can be carried out entirely in a CMOS processes production line complemented with CMOS compatible post-processing approaches. Mic-in-CMOS has the advantage of low production cost with minimal packaging requirement and on-die EMI / EMC. © 2020 IEEE.en_US
dc.language.isoenen_US
dc.publisherIEEE Computer Societyen_US
dc.relation.ispartof2020 IEEE International Ultrasonics Symposium (IUS)en_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectCapacitive microphoneen_US
dc.subjectCMOSen_US
dc.subjectCMUTen_US
dc.subjectMEMSen_US
dc.subjectSealed gapen_US
dc.titleMic-In Cmut as a Sealed-Gap Capacitive Microphoneen_US
dc.typeConference Objecten_US
dc.departmentFaculties, Faculty of Engineering, Department of Electrical and Electronics Engineeringen_US
dc.departmentFakülteler, Mühendislik Fakültesi, Elektrik ve Elektronik Mühendisliği Bölümütr_TR
dc.authorid0000-0002-7233-2704-
dc.identifier.wosWOS:000635688900253en_US
dc.identifier.scopus2-s2.0-85097894617en_US
dc.institutionauthorKöymen, Itır-
dc.identifier.doi10.1109/IUS46767.2020.9251557-
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.identifier.scopusquality--
item.openairetypeConference Object-
item.languageiso639-1en-
item.grantfulltextnone-
item.fulltextNo Fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.cerifentitytypePublications-
crisitem.author.dept02.5. Department of Electrical and Electronics Engineering-
Appears in Collections:Elektrik ve Elektronik Mühendisliği Bölümü / Department of Electrical & Electronics Engineering
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection
Show simple item record



CORE Recommender

Page view(s)

142
checked on Dec 16, 2024

Google ScholarTM

Check




Altmetric


Items in GCRIS Repository are protected by copyright, with all rights reserved, unless otherwise indicated.