Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.11851/3870
Title: Fabry-Perot Microtube Cavity Structure for Optical Sensing at Mid-Infrared Spectrum
Authors: Babayiğit, Ceren
Boztuğ, Çiçek
Kurt, Hamza
Turduev, Mirbek
Keywords: Fabry-Perot
nanotubes
nanosensors
optical sensors
refractive index
sensitivity
sensitivity analysis
Publisher: Institute of Electrical and Electronics Engineers Inc.
Source: Babayigit, C., Boztug, C., Kurt, H. and Turduev, M. (2019). Fabry–Pérot Microtube Cavity Structure for Optical Sensing at Mid-infrared Spectrum. IEEE Sensors Journal, 20(5), 2390-2397.
Abstract: In this manuscript, we propose and design two different Fabry-Perot microtube cavity refractometer configurations operating at mid-infrared (mid-IR) wavelengths. The designed refractometers' topologies are based on single-walled and double-walled cylindrical Si-microtubes. Here, by infiltrating the target analyte into the cavity region, the light is localized and high-depth light-matter interaction is achieved to reveal sensing characteristic of the structure. Numerical analyses and performance evaluations of the designed refractometers are carried out by using the three-dimensional finite difference time domain (3D FDTD) method. In this regard, for the single-walled microtube configuration, overall sensitivity is calculated to be around 2340 nm/RIU. Moreover, to reduce the cross talks and to sharpen resonance peaks, the double-walled microtube design is introduced and overall sensitivity is found to be around 1820 nm/RIU. In addition, the possible fabrication and optical characterization approaches of the designed structure are also discussed. The proposed configurations of the refractometer are compact, feasible for manufacture, simple for optical measurements and, importantly, provide label free sensing characteristics. We think that the presented study may broaden further the research on the mid-IR label-free refractometer-based sensing devices for detection of various liquid and gaseous materials.
URI: https://hdl.handle.net/20.500.11851/3870
https://ieeexplore.ieee.org/document/8903322
ISSN: 1530-437X
Appears in Collections:Elektrik ve Elektronik Mühendisliği Bölümü / Department of Electrical & Electronics Engineering
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection

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