Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.11851/12204
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dc.contributor.authorKöymen, Itır-
dc.contributor.authorBozat, Özgür-
dc.contributor.authorÖztoprak, İlker-
dc.contributor.authorGökçe, Aisha-
dc.contributor.authorChan, (Sam) Yun Fu-
dc.contributor.authorBrown, Gavin-
dc.contributor.authorDouglas, Robert-
dc.date.accessioned2025-04-01T14:43:34Z-
dc.date.available2025-04-01T14:43:34Z-
dc.date.issued2024-
dc.identifier.urihttps://drive.google.com/file/d/1gM7puknncJxsP4pLWs8qCOJUTpEX-iNf/view?usp=sharing-
dc.identifier.urihttps://hdl.handle.net/20.500.11851/12204-
dc.descriptionNanoTR-18 18th Nanoscience And Nanotechnology Conference 26-28 August 2024, Koç University, İstanbul - Türkiyeen_US
dc.description.abstract[No Abstract Available]en_US
dc.language.isoenen_US
dc.publisherKoç Universityen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.titleElectrical characterization of ALD grown HfO2 memristive devices and their noise analysisen_US
dc.typeConference Objecten_US
dc.identifier.startpage28en_US
dc.identifier.endpage28en_US
dc.authorid0000-0002-7233-2704-
dc.institutionauthorKöymen, Itır-
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
item.cerifentitytypePublications-
item.fulltextNo Fulltext-
item.grantfulltextnone-
item.languageiso639-1en-
item.openairetypeConference Object-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
crisitem.author.dept02.5. Department of Electrical and Electronics Engineering-
Appears in Collections:Elektrik ve Elektronik Mühendisliği Bölümü / Department of Electrical & Electronics Engineering
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