Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.11851/11003
Full metadata record
DC FieldValueLanguage
dc.contributor.authorSevimçok, S.-
dc.contributor.authorGirici, T.-
dc.date.accessioned2024-01-21T09:24:32Z-
dc.date.available2024-01-21T09:24:32Z-
dc.date.issued2023-
dc.identifier.isbn9798350304299-
dc.identifier.urihttps://doi.org/10.1109/ICEEE59925.2023.00072-
dc.identifier.urihttps://hdl.handle.net/20.500.11851/11003-
dc.descriptionMarmara Universityen_US
dc.description10th International Conference on Electrical and Electronics Engineering, ICEEE 2023 -- 8 May 2023 through 10 May 2023 -- 194296en_US
dc.description.abstractThis paper provides a reliability, availability and Mean Time Between Failure (MTBF) analysis for a sample DC/DC converter and Discrete I/O electronic circuit stages. These analyses were performed using the Failure Tree Analyses (FTA) approach. The reason for choosing these structures is that they are frequently used in today's electronic design. In this study, the effect of the importance of reliability on the whole system, starting from a component in electronic circuit design, has been demonstrated. © 2023 IEEE.en_US
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en_US
dc.relation.ispartofProceedings - 2023 10th International Conference on Electrical and Electronics Engineering, ICEEE 2023en_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectAvailability; electronic design; FTA; MTBF; reliabilityen_US
dc.subjectDC-DC converters; Electric network analysis; Integrated circuit manufacture; Reliability analysis; Timing circuits; Availability analysis; Electronic circuit design; Electronic design; Electronics circuits; Failure tree analyze; Failure trees; Mean time between failures; Reliability and availability; Mean time between failuresen_US
dc.titleReliability and Availability Analysis for Electronic Circuit Designen_US
dc.typeConference Objecten_US
dc.departmentTOBB ETÜen_US
dc.identifier.startpage362en_US
dc.identifier.endpage367en_US
dc.identifier.scopus2-s2.0-85179000622en_US
dc.institutionauthor…-
dc.identifier.doi10.1109/ICEEE59925.2023.00072-
dc.authorscopusid58751095800-
dc.authorscopusid24485519800-
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
item.cerifentitytypePublications-
item.grantfulltextnone-
item.openairetypeConference Object-
item.fulltextNo Fulltext-
item.languageiso639-1en-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
Appears in Collections:Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
Show simple item record



CORE Recommender

Page view(s)

8
checked on Aug 5, 2024

Google ScholarTM

Check




Altmetric


Items in GCRIS Repository are protected by copyright, with all rights reserved, unless otherwise indicated.