Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.11851/10068
Full metadata record
DC FieldValueLanguage
dc.contributor.authorAbella, Jaume-
dc.contributor.authorVera, Xavier-
dc.contributor.authorÜnsal, Osman S.-
dc.contributor.authorErgin, Oğuz-
dc.contributor.authorGonzalez, Antonio-
dc.contributor.authorTschanz, James W.-
dc.contributor.authorKartal, Yavuz Selim-
dc.date.accessioned2023-01-09T11:49:01Z-
dc.date.available2023-01-09T11:49:01Z-
dc.date.issued2008-
dc.identifier.issn0272-1732-
dc.identifier.issn1937-4143-
dc.identifier.urihttps://doi.org/10.1109/MM.2008.92-
dc.identifier.urihttps://hdl.handle.net/20.500.11851/10068-
dc.description.abstractElectromigration is a major source of wire and via failure. Refueling undoes em for bidirectional wires and power/ground grids-some of a chip's most vulnerable wires. Refueling exploits em's self-healing effect by balancing the amount of current flowing in both directions of a wire. It can significantly extend a wire's lifetime while reducing the chip area devoted to wires.en_US
dc.description.sponsorshipGerman Federal Ministry of Education and Research (BMBF) [01FP20031J]en_US
dc.language.isoenen_US
dc.publisherIEEE MICROen_US
dc.relation.ispartofExperimental Ir Meets Multilinguality, Multimodality, and Interaction (Clef 2022)en_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectFAILUREen_US
dc.titleRefueling: Preventing wire degradation due to electromigrationen_US
dc.typeArticleen_US
dc.departmentESTÜen_US
dc.identifier.volume28en_US
dc.identifier.issue6en_US
dc.identifier.startpage37en_US
dc.identifier.endpage46en_US
dc.identifier.wosWOS:000261998900005en_US
dc.institutionauthorErgin, Oğuz-
dc.identifier.doi10.1109/MM.2008.92-
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
item.openairetypeArticle-
item.languageiso639-1en-
item.grantfulltextnone-
item.fulltextNo Fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.cerifentitytypePublications-
crisitem.author.dept02.3. Department of Computer Engineering-
Appears in Collections:Bilgisayar Mühendisliği Bölümü / Department of Computer Engineering
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection
Show simple item record



CORE Recommender

SCOPUSTM   
Citations

15
checked on Dec 21, 2024

WEB OF SCIENCETM
Citations

13
checked on Dec 21, 2024

Page view(s)

134
checked on Dec 16, 2024

Google ScholarTM

Check




Altmetric


Items in GCRIS Repository are protected by copyright, with all rights reserved, unless otherwise indicated.