Browsing by Subject Integrated Circuit Reliability
Showing results 1 to 2 of 2
| Issue Date | Title | Author(s) |
|---|---|---|
| 2012 | Exploiting Bus Level and Bit Level Inactivity for Preventing Wire Degradation Due To Electromigration | Kayaalp, Mehmet; Koç, F.; Ergin, Oğuz |
| 2012 | Improving the Soft Error Resilience of the Register Files Using Sram Bitcells With Built-In Comparators | Kayaalp, Mehmet; Koç, F.; Ergin, Oğuz |